Structural and optical properties of Ba(CoX, Ti 1-X)O3 thin films fabricated by sol-gel process

Applied Physics Letters

Volumn 85, Issue 11, 2004, Pages 1964-1966

  Li, Y W ^a   Sun, J L ^a   Meng, X J ^a   Chu, J H ^a   Zhang, W F ^b  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b HENAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; BARIUM COMPOUNDS; COBALT; ELECTRON ENERGY LEVELS; ELECTROOPTICAL DEVICES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPACITY; SEMICONDUCTOR MATERIALS; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

DYNAMIC ACCESS MEMORY; FUSED QUARTZ SURFACE; SOL-GEL PROCESS; STRUCTURAL PROPERTIES;

THIN FILMS;

EID: 5444236259     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1786654     Document Type: Article

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