Barkhausen noise and eddy current microscopy - A new scanning probe technique for microscale characterization of materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5392, Issue , 2004, Pages 105-113

  Szielasko, Klaus ^a   Lugin, Sergey ^a   Kopp, Melanie ^a   Altpeter, Iris ^a  

^a FRAUNHOFER INSTITUTE FOR NONDESTRUCTIVE TESTING IZFP   (Germany)

Author keywords

Barkhausen noise; BEMI; Coating; Eddy current; Imaging; Microscopy; Microstructure; Residual stress; Thickness; Thin films

Indexed keywords

COATINGS; DATA ACQUISITION; DEFECTS; EDDY CURRENTS; HARDNESS; HEAT TREATMENT; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; RESIDUAL STRESSES; SCANNING; SUBSTRATES; SURFACE PHENOMENA; THICKNESS MEASUREMENT; THIN FILMS;

3-D IMAGES; BARKHAUSEN NOISE; BEMI; MICRO-IMPERFECTIONS;

MATERIALS HANDLING;

EID: 5444230649     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540463     Document Type: Conference Paper

References (8)

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