DeMIMA: A multilayered approach for design pattern identification

IEEE Transactions on Software Engineering

Volumn 34, Issue 5, 2008, Pages 667-684

  Guéhéneuc, Yann Gaël ^a   Antoniol, Giuliano ^b  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Design patterns; Interclass relationships; Maintenance traceability

Indexed keywords

ABSTRACTING; CODES (SYMBOLS); COMPUTER PROGRAMMING; CONSTRAINT THEORY; DESIGN; MAINTENANCE; OBJECT ORIENTED PROGRAMMING;

ABSTRACT MODELS; BINARY CLASS RELATIONSHIPS; CONSTRAINT PROGRAMMINGS; DESIGN MOTIFS; DESIGN PATTERNS; DESIGN PROBLEMS; INDUSTRIAL COMPONENTS; INTERCLASS RELATIONSHIPS; MULTILAYERED APPROACHES; OBJECT-ORIENTED PROGRAMMINGS; QUALITY OF SOFTWARES; SOURCE CODES; SOURCE SYSTEMS; SYSTEM MAINTENANCES; TWO LAYERS;

ARCHITECTURAL DESIGN;

EID: 54249161556     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.2008.48     Document Type: Article

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