Investigations of the effect of curing conditions on the structure and stability of amino-functionalized organic films on silicon substrates by Fourier transform infrared spectroscopy, ellipsometry, and fluorescence microscopy

Surface Science

Volumn 602, Issue 21, 2008, Pages 3323-3330

  Kim, Joonyeong ^a   Seidler, Paul ^a   Fill, Catherine ^a   Wan, Lai Sze ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

3 Aminopropyltriethoxysilane; APTES; Ellipsometry; Fluorescence microscopy; Grazing angle attenuated total reflection; SAMs; Self assembled monolayers; Silanization

Indexed keywords

AMINATION; AMINES; CURING; ELLIPSOMETRY; FLUORESCENCE; FLUORESCENCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; INFRARED SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; NITROGEN COMPOUNDS; POLYVINYL ALCOHOLS; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTING SILICON COMPOUNDS; SILANES; SILICON; SILICON COMPOUNDS; SILICON WAFERS; SOLUTIONS; SONICATION; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; TOLUENE;

3-AMINOPROPYLTRIETHOXYSILANE; APTES; GRAZING-ANGLE ATTENUATED TOTAL REFLECTION; SAMS; SILANIZATION;

FILM PREPARATION;

EID: 54249113912     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.09.001     Document Type: Article

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