Light-emitting-diode inspection using a flatbed scanner

Optical Engineering

Volumn 47, Issue 10, 2008, Pages

  Tan, Han Yen ^a   Ng, Tuck Wah ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Flatbed scanners; Inspection; Light emitting diodes

Indexed keywords

DIODES; ELECTROMAGNETIC WAVES; INSPECTION; LIGHT EMISSION; SCANNING;

DEMANDING APPLICATIONS; FLATBED SCANNERS; GONIOPHOTOMETERS; LOWER COSTS; NONUNIFORMITY; SPECIALIZED EQUIPMENTS; WHITE LEDS;

LIGHT EMITTING DIODES;

EID: 54149106131     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2995991     Document Type: Article

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