Structure, elemental composition, and mechanical properties of films prepared by radio-frequency magnetron sputtering of hydroxyapatite

Glass Physics and Chemistry

Volumn 34, Issue 5, 2008, Pages 608-616

  Ievlev, V M ^a   Domashevskaya, E P ^a   Putlyaev, V I ^b   Tret'Yakov, Yu D ^b   Barinov, S M ^c   Belonogov, E K ^d   Kostyuchenko, A V ^d   Petrzhik, M I ^e   Kiryukhantsev Korneev, F V ^e  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^d VORONEZH STATE TECHNICAL UNIVERSITY   (Russian Federation)

^e NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; APATITE; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; AUGERS; BACKSCATTERING; BOND STRENGTH (MATERIALS); CALCIUM; DIFFRACTION; ELECTRIC DISCHARGES; ELECTROMAGNETIC WAVE EMISSION; ELECTROMAGNETIC WAVES; ELECTRON DIFFRACTION; ELECTRONS; EMISSION SPECTROSCOPY; HARDENING; HARDNESS; HIGH ENERGY PHYSICS; HYDROXYAPATITE; INORGANIC COATINGS; ION BEAMS; MAGNETRON SPUTTERING; MAGNETRONS; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; MOLECULAR SPECTROSCOPY; RADIO BROADCASTING; RADIO TRANSMISSION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRUCTURE (COMPOSITION); SUBSTRATES; THICK FILMS; TITANIUM; TITANIUM CARBIDE; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING; X RAYS;

ADHESION STRENGTHS; AUGER ELECTRONS; COMPOSITE LAYERS; DENSE STRUCTURES; DIFFERENT SUBSTRATES; ELEMENTAL COMPOSITIONS; ENERGY ELECTRON DIFFRACTIONS; EROSION ZONES; FORCE MICROSCOPIES; HYDROXYAPATITE CERAMICS; HYDROXYAPATITE COATINGS; HYDROXYAPATITE FILMS; IR SPECTROSCOPIES; NANO-INDENTATION; NANOCRYSTALLINE; PLASMA DISCHARGES; RUTHERFORD BACKSCATTERINGS; SCRATCHING; SPATIAL INHOMOGENEITY; SPECTROSCOPIC DATUM; STOICHIOMETRIC COMPOSITIONS; SUB-STRUCTURE; TITANIUM SUBSTRATES; X-RAY DIFFRACTIONS;

AUGER ELECTRON SPECTROSCOPY;

EID: 54149102813     PISSN: 10876596     EISSN: None     Source Type: Journal    
DOI: 10.1134/S108765960805012X     Document Type: Article

References (13)

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