Enhanced polarization and dielectric properties of Pb (Zr 1-xTix)O3 thin films

Journal of Applied Physics

Volumn 104, Issue 7, 2008, Pages

  Ortega, N ^a   Kumar, Ashok ^a   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CERAMIC CAPACITORS; DATA STORAGE EQUIPMENT; DIELECTRIC PROPERTIES; DIFFRACTION; FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; HOLOGRAPHIC INTERFEROMETRY; LEAD; LEAD ALLOYS; OXIDE MINERALS; OZONE WATER TREATMENT; PEROVSKITE; PHASE TRANSITIONS; PHOTODEGRADATION; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PLATINUM; POLARIZATION; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; THICK FILMS; THIN FILMS; ZIRCONIUM;

AC CONDUCTIVITIES; ANNEALING TEMPERATURES; CRYSTALLINE ORIENTATIONS; ENHANCED POLARIZATIONS; FATIGUE CHARACTERISTICS; FERROELECTRIC PHASE TRANSITIONS; FREQUENCY DEPENDENT POLARIZATIONS; GRAIN SIZES; INTRINSIC NATURES; LARGE DIELECTRIC CONSTANTS; PHASE-TRANSITION; PLATINIZED SILICON SUBSTRATES; PREFERENTIAL GROWTHS; PULSED LASER DEPOSITION TECHNIQUES; PZT THIN FILMS; REMANENT POLARIZATIONS; ROOM TEMPERATURES;

GRAIN GROWTH;

EID: 54049150380     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976348     Document Type: Article

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