X-ray nanofocus CT: Visualising of internal 3D-structures with submicrometer resolution

AIP Conference Proceedings

Volumn 1050, Issue , 2008, Pages 3-14

  Weinekoetter, Christian ^a  

^a GE Sensing and Inspection Technologies GmbH   (Germany)

Author keywords

3D micro analysis; High resolution X ray computed tomography; NanoCT

Indexed keywords

EID: 54049147866     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2999992     Document Type: Conference Paper

References (0)