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Volumn 465, Issue 1-3, 2008, Pages 131-135
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Concentration profile within diffusion layer under non-forced hydrodynamic conditions measured by Michelson interferometer
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Author keywords
[No Author keywords available]
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Indexed keywords
CONCENTRATION (PROCESS);
FLUID DYNAMICS;
HYDRODYNAMICS;
INTERFEROMETERS;
INTERFEROMETRY;
MICHELSON INTERFEROMETERS;
OPTICAL INSTRUMENTS;
SEMICONDUCTOR DOPING;
SUBSTITUTION REACTIONS;
BULK SOLUTIONS;
CONCENTRATION PROFILES;
DIFFUSION LAYERS;
GALVANIC DISPLACEMENTS;
HYDRODYNAMIC CONDITIONS;
IN DIFFUSIONS;
INTERFERENCE FRINGING;
LONG TIMES;
STEADY DIFFUSIONS;
WORKING ELECTRODES;
DIFFUSION;
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EID: 54049144570
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2008.09.034 Document Type: Article |
Times cited : (18)
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References (21)
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