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Volumn 465, Issue 1-3, 2008, Pages 131-135

Concentration profile within diffusion layer under non-forced hydrodynamic conditions measured by Michelson interferometer

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); FLUID DYNAMICS; HYDRODYNAMICS; INTERFEROMETERS; INTERFEROMETRY; MICHELSON INTERFEROMETERS; OPTICAL INSTRUMENTS; SEMICONDUCTOR DOPING; SUBSTITUTION REACTIONS;

EID: 54049144570     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2008.09.034     Document Type: Article
Times cited : (18)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.