X-ray photoelectron diffraction on the 6-fold (001) μ-Al4Mn approximant surface

Philosophical Magazine

Volumn 88, Issue 13-15, 2008, Pages 2095-2102

  Widmer, R ^a   Maeder, R ^a   Heggen, M ^b   Feuerbacher, M ^b   Groning O ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aluminium alloys; Aperiodic materials; Approximants; Intermetallic alloys; Photoelectron spectroscopy; Quasicrystals; Structure; Surface analysis

Indexed keywords

ALLOYS; ALUMINUM; ALUMINUM ALLOYS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC WAVES; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; INTERMETALLICS; MANGANESE; MANGANESE COMPOUNDS; METALLIC COMPOUNDS; PERIODIC STRUCTURES; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; QUASICRYSTALS; SURFACE PROPERTIES; SURFACE STRUCTURE; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINIUM ALLOYS; APERIODIC MATERIALS; APPROXIMANTS; INTERMETALLIC ALLOYS; STRUCTURE;

SURFACE ANALYSIS;

EID: 54049135616     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701846222     Document Type: Article

References (15)

1. D. Shechtman, J. Blech, D. Gratias et al., Phys. Rev. Lett. 53 (1984) p. 1951.
2. Z.M. Stadnik (ed.), Physical Properties of Quasicrystals, Springer Series in Solid State Sciences, Vol. 166, Springer, Berlin, 1999.
3. J.B. Suck, M. Schreiber, P. Häussler (eds.), Quasicrystals: An Introduction to Structure, Physical Properties and Applications, Springer Series in Materials Sciences, Vol. 55, Springer, Berlin, 2002.
4. E. Rotenberg, W. Theis, K. Horn et al., Nature 406 (2000) p.602;
5. E. Rotenberg, W. Theis and K. Horn, Prog. Surf. Sci. 75 (2004) p.237;
6. W. Theis, E. Rotenberg, K. J. Franke et al., Phys. Rev. B 68 (2003 )p.104205.
7. X.L. Ma, X.Z. Li and K.H. Kuo, Acta Crystallogr. B 51 (1995) p.36.
8. H. Zhang and K.H. Kuo, Phys. Rev. B 42 (1990) p.8907.
9. Z.B. He and K.H. Kuo, J. Alloys Comp. 373 (2004) p.39;
10. Z.B. He, X.D. Zou, S. Hovmöller et al., Ultramicroscopy 107 (2007) p.495.
11. C.B. Shoemaker, D.A. Keszler and D.P. Shoemaker, Acta Crystallogr. B 45 (1989) p. 13, and references herein.
12. C.B. Shoemaker, Phil. Mag. B 67 (1993) p.869.
13. C.S. Fadley, Synchrotron Radiation Research: Advances in Surface and Interface Science, Vol. 1: Techniques, Plenum Press, New York, 1992, and references herein.
14. P.A. Bennett and M.W. Webb, Surf. Sci. 104 (1981) p.74.
15. National Institute of Standards and Technology, Standard Reference Database 71, Version 1.1, 2000.