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Volumn 94, Issue 2, 2009, Pages 463-473

Bayesian estimation of mixed Weibull distributions

Author keywords

Bayesian analysis; Maximum likelihood estimation; Mixed Weibull distribution

Indexed keywords

BAYESIAN NETWORKS; BLOCK CODES; IMAGE SEGMENTATION; MAXIMUM LIKELIHOOD; PARAMETER ESTIMATION; TURBO CODES; WEIBULL DISTRIBUTION;

EID: 54049124047     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2008.05.004     Document Type: Article
Times cited : (31)

References (7)
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    • Paulsen J, Reed E, Kelley J. Reliability of tantalum polymer capacitors. In: Proceedings of CARTS Europe, 2004.
    • Paulsen J, Reed E, Kelley J. Reliability of tantalum polymer capacitors. In: Proceedings of CARTS Europe, 2004.
  • 2
    • 0023288393 scopus 로고
    • Limited failure population life tests, application to integrated circuit reliability
    • Meeker W.Q. Limited failure population life tests, application to integrated circuit reliability. Technometrics 29 (1987) 51-65
    • (1987) Technometrics , vol.29 , pp. 51-65
    • Meeker, W.Q.1
  • 3
    • 0035369607 scopus 로고    scopus 로고
    • Bayesian calculation of cost optimal burn-in durations for mixed exponential populations
    • Perlstein D., Jarvis W., and Mazzuchi T. Bayesian calculation of cost optimal burn-in durations for mixed exponential populations. Reliab Eng Syst Saf 72 (2001) 265-273
    • (2001) Reliab Eng Syst Saf , vol.72 , pp. 265-273
    • Perlstein, D.1    Jarvis, W.2    Mazzuchi, T.3
  • 5
    • 0008310958 scopus 로고
    • Bayesian estimation of life parameters in the Weibull distribution
    • Canavos G., and Tsokos C. Bayesian estimation of life parameters in the Weibull distribution. Oper Res 21 (1973) 755-763
    • (1973) Oper Res , vol.21 , pp. 755-763
    • Canavos, G.1    Tsokos, C.2
  • 6
    • 0014599667 scopus 로고
    • Bayesian analysis of the Weibull Process with unknown scale and shape parameters
    • Soland R. Bayesian analysis of the Weibull Process with unknown scale and shape parameters. IEEE Trans Reliab R-18 (1969) 181-184
    • (1969) IEEE Trans Reliab , vol.R-18 , pp. 181-184
    • Soland, R.1
  • 7
    • 15744395866 scopus 로고    scopus 로고
    • The trunsored model and its applications to lifetime analysis: unified censored and truncated models
    • Hirose H. The trunsored model and its applications to lifetime analysis: unified censored and truncated models. IEEE Trans Reliab 54 1 (2005) 11-21
    • (2005) IEEE Trans Reliab , vol.54 , Issue.1 , pp. 11-21
    • Hirose, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.