Determination of the crystallization ratio in a series of Fe-containing vitroceramic products by means of XAFS spectroscopies

Journal of Non-Crystalline Solids

Volumn 354, Issue 45-46, 2008, Pages 5053-5059

  Pinakidou, F ^a   Katsikini, M ^a   Paloura, E C ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Chemical vapor deposition; Conductivity; Crystal growth; Heterojunctions; III V semiconductors; Laser deposition; Nuclear and chemical wastes; Oxynitride glasses; Plasma deposition; Silicates; Silicon; Sputtering; Vapor phase deposition; X ray absorption; X ray fluorescence

Indexed keywords

ABSORPTION; CRYSTALLIZATION; NANOCRYSTALLINE ALLOYS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

CHEMICAL VAPOR DEPOSITION; CONDUCTIVITY; CRYSTAL GROWTH; HETEROJUNCTIONS; III-V SEMICONDUCTORS; LASER DEPOSITION; NUCLEAR AND CHEMICAL WASTES; OXYNITRIDE GLASSES; PLASMA DEPOSITION; SILICATES; SILICON; SPUTTERING; VAPOR PHASE DEPOSITION; X-RAY ABSORPTION; X-RAY FLUORESCENCE;

ABSORPTION SPECTROSCOPY;

EID: 53949119356     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.08.003     Document Type: Article

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