EXAFS study of the Er3+ ion coordination in SiO2-TiO2-HfO2 sol-gel films

Journal of Non-Crystalline Solids

Volumn 354, Issue 45-46, 2008, Pages 4940-4943

  d'Acapito, Francesco ^a   Marques, Ana C ^b   Santos, Luís F ^b   Almeida, Rui M ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Planar waveguides; Rare earths in glasses; X ray absorption

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ERBIUM; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; HAFNIUM OXIDES; HEAT TREATMENT; IONS; PLANAR WAVEGUIDES; RARE EARTHS; SILICA; SILICON; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; TITANIUM DIOXIDE; X RAY ABSORPTION;

COORDINATION SHELLS; EXAFS STUDIES; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FILM COMPOSITION; ION IMPLANTED; POST-IMPLANTATION; RARE-EARTHS IN GLASS; SOLGEL FILMS;

ION IMPLANTATION;

EID: 53949099843     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.07.008     Document Type: Article

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