Improvement of the contact resistance between ITO and pentacene using various metal-oxide interlayers

Organic Electronics

Volumn 9, Issue 6, 2008, Pages 1140-1145

  Kim, Hyoungsub ^a   Sohn, Sunyoung ^b   Jung, Donggeun ^b   Maeng, Wan Joo ^c   Kim, Hyungjun ^c   Kim, Tae Sang ^d   Hahn, Jungseok ^d   Lee, Sangyun ^d   Yi, Yeonjin ^e   Cho, Mann Ho ^f  

^a Sungkyunkwan University   (South Korea)

^b Institute for Basic Science   (South Korea)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

^d Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^e Korea Research Institute of Standards and Science   (South Korea)

^f Yonsei University   (South Korea)

Author keywords

Contact resistance; Metal oxide; Organic thin film transistors; Photoelectron spectroscopy

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC LAYER DEPOSITION; CHARGE INJECTION; COMPOSITE FILMS; CONTACT RESISTANCE; HIGH-K DIELECTRIC; INDIUM COMPOUNDS; METALS; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SEMICONDUCTING ORGANIC COMPOUNDS; TANTALUM OXIDES; THIN FILM CIRCUITS; THIN FILM TRANSISTORS; TIN OXIDES; TITANIUM DIOXIDE;

ELECTRONIC BAND; HOLE INJECTION BARRIERS; INDIUM TIN OXIDE; METAL OXIDES; ORGANIC THIN FILM TRANSISTORS; PENTACENES; TIO2 FILM; ULTRA-THIN;

THIN FILMS;

EID: 53749083280     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2008.08.008     Document Type: Article

References (17)

1. Pesavento P.V., Puntambekar K.P., Frisbie C.D., McKeen J.C., and Ruden P.P. J. Appl. Phys. 99 (2006) 094504
2. Lee S., Koo B., Park J.-G., Moon H., Hahn J., and Kim J.M. MRS Bull. 31 (2006) 455
3. Choi J.H., Lee E.S., Choi S.H., Baik H.K., Song K.M., Lim Y.S., and Lee S.M. J. Vac. Sci. Technol. A 23 (2005) 1479
4. Chen T.H., Liou Y., Wu T.J., and Chen J.Y. Appl. Phys. Lett. 85 (2004) 2092
5. Van Slyke S.A., Chen C.H., and Tang C.W. Appl. Phys. Lett. 69 (1996) 2160
6. Qiu C., Xie Z., Chen H., Wong M., and Kwok H.S. J. Appl. Phys. 93 (2003) 3253
7. Sohn S., Park K., Jung D., Kim H., Chae H., Kim H.M., Yi J., Cho M.-H., and Boo J.-H. Jpn. J. Appl. Phys. 46 (2007) L461
8. Robertson J. J. Vac. Sci. Technol. B 18 (2000) 1785
9. Maeng W.J., and Kim H. Electrochem. Solid-State Lett. 9 (2006) G191
10. Jang Y., Kim D.H., Park Y.D., Cho J.H., Hwang M., and Cho K. Appl. Phys. Lett. 87 (2005) 152105
11. Wang G., Moses D., Heeger A.J., Zhang H.-M., Narasimhan M., and Demaray R.E. J. Appl. Phys. 95 (2004) 316
12. Schlaf R., Schroeder P.G., Nelson M.W., Parkinson B.A., Merritt C.D., Crisafulli L.A., Murata H., and Kafafi Z.H. Surf. Sci. 450 (2000) 142
13. Gassenbauer Y., and Klein A. Solid State Ionics 173 (2004) 141
14. Yi Y., Lyon J.E., Beerbom M.M., and Schlaf R. J. Appl. Phys. 100 (2006) 093719
15. Shen C., and Kahn A. Org. Electron. 2 (2001) 89
16. Silinsh E.A., and Cápek V. Organic Molecular Crystals: Interaction, Localization and Transport Phenomena (1994), American Institute of Physics, New York
17. Watkins N.J., Zorba S., and Gao Y.L. J. Appl. Phys. 96 (2004) 425