Poly (3-dodecylthiophene) Langmuir-Blodgett films: Preparation and characterization

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 330, Issue 1, 2008, Pages 62-66

  Niu, Jin Zhong ^a   Cheng, Gang ^a   Li, Zhaohan ^a   Wang, Hongzhe ^a   Lou, Shiyun ^a   Du, Zuliang ^a   Li, Lin Song ^a  

^a HENAN UNIVERSITY   (China)

Author keywords

Langmuir Blodgett technique; Photo assistant conducting AFM; Polythiophene

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ACIDS; AGGLOMERATION; ATMOSPHERIC TEMPERATURE; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; FILM PREPARATION; FLUORESCENCE; LIGHT; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; ORGANIC POLYMERS; OXIDE FILMS; STEARIC ACID; TIN; TITANIUM COMPOUNDS; TOLUENE; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ABSORPTION AND FLUORESCENCE SPECTRA; AFM MEASUREMENTS; ATOMIC FORCE MICROSCOPE; CONDUCTING AFM; FLUORESCENCE SPECTRUM; INDIUM TIN OXIDE SUBSTRATES; LANGMUIR-BLODGETT; LANGMUIR-BLODGETT TECHNIQUE; LANGMUIR-BLODGETT TECHNIQUES; LB FILMS; MEAN MOLECULAR AREA; ORDERED STRUCTURES; PHOTO-ASSISTANT CONDUCTING AFM; PHOTO-CURRENT RESPONSE; POLY(3 DODECYLTHIOPHENE); POLYTHIOPHENE; RED-SHIFT PHENOMENA; SURFACE PRESSURES; TOPOGRAPHIC IMAGING; UV-LIGHT IRRADIATION;

LANGMUIR BLODGETT FILMS;

POLY(3 DODECYLTHIOPHENE); THIOPHENE DERIVATIVE; UNCLASSIFIED DRUG;

ABSORPTION; ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; FLUORESCENCE SPECTROSCOPY; ISOTHERM; LANGMUIR BLODGETT FILM; PRIORITY JOURNAL; SURFACE PROPERTY; TOPOGRAPHY; ULTRAVIOLET RADIATION; X RAY DIFFRACTION;

EID: 53649100390     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2008.07.041     Document Type: Article

References (17)

1. Chen T.-A., and Rieke R.D. J. Am. Chem. Soc. 114 (1992) 10087-10088
2. Chen T.-A., Wu X., and Rieke R.D. J. Am. Chem. Soc. 117 (1995) 233-244
3. Wang C., Schindler J.L., Kannewurf C.R., and Kanatzidis M.G. Chem. Mater. 7 (1996) 58-68
4. Chittibabu K.G., Li L., Kamath M., Kumar J., and Tripathy S.K. Chem. Mater. 6 (1994) 475-480
5. Beek W.J.E., Wienk M.M., and Janssen R.A.J. Adv. Funct. Mater. 16 (2006) 1112-1116
6. Kline R.J., McGehee M.D., Kadnikova E.N., Liu J.S., and Fréchet J.M.J. Adv. Mater. 15 (2003) 1519-1522
7. Li A.D.Q., and Li L.S. J. Phys. Chem. B 108 (2004) 12842-12850
8. Cazeca M.J., Chittibabu K.G., Kim J., Kumar J., Jain A., Kim W., and Tripathy S.K. Synth. Met. 98 (1998) 45-49
9. Park Y.H., Kim S.J., and Lee J.Y. Thin Solid Films 425 (2003) 233
10. Dhanabalan A., Dabke R.B., Kumar N.P., Talwar S.S., Major S., Lai R., and Contractor A.Q. Langmuir 13 (1997) 4395-4400
11. Watanabe I., Hong K., and Bubner M.F. Thin Solid Films 179 (1989) 199-206
12. Xu G.F., Bao Z.N., and Groves J.T. Langmuir 16 (2000) 1834-1841
13. Xu Y., Liu Y.Q., Wu J., and Zhu D.B. J. Appl. Polym. Sci. 69 (1998) 1-6
14. Hwang M.J., and Kim K. Langmuir 15 (1999) 3563-3569
15. Sirringhaus H., Brown P.J., Friend R.H., Nielsen M.M., Bechgaard K., Langeveld-Voss B.M.W., Spiering A.J.H., Janssen R.A.J., Meijer E.W., Herwig P., and de Leeuw D.M. Nature 401 (1999) 685-688
16. Rumbles G., Samuel I.D.W., Magnani L., Murray K.A., DeMello A.J., Crystall B., Moratti S.C., Stone B.M., Holmes A.B., and Friend R.H. Synth. Met. 76 (1996) 47-51
17. Wang S.J., Zhang X.T., Cheng G., Jiang X.H., Li Y.C., Huang Y.B., and Du Z.L. Chem. Phys. Lett. 405 (2005) 63-67