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3 type, with cc stacking;
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3 type, with cc stacking;
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22
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0000524868
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Structure determination: All structures were solved from single-crystal diffraction data [MoKα radiation with a graphite monochromator, 293(2) K, using single crystals selected in an argon-filled glove box and sealed in a glass capillary (with a diameter of 0.3 mm, Data collection was carried out on an Enraf-Nonius CCD diffractometer with rotating anode and a Nonius DIP diffractometer with image plate detector. For crystal data, see Table 1. Structure refinement details in the order: chemical formula, measured reflections, independent reflections, R1 and wR 2 (all data, 2) Ba4Sn10.27Bi 1.73(3, 14134, 510, 0.030, 0.094; (3) Ba13Sn 33.19Bi5.81(4, 23243, 1281, 0.037, 0.065; (4) Ba5Sn11.34Bi3.66(6, 17061, 508, 0.039, 0.094; (5) Ba2Sn4.03Bi1.974, 11116, 401, 0.061, 0.152
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[17c] with anisotropic displacement parameters for all atoms. Disorder was checked with all atomic positions, but only the Bi positions in the c layers were found to be partially substituted by Sn atoms. Further details on the crystal-structure investigation(s) may be obtained from the Fachinformationszentrum Karlsruhe, 76344 Eggenstein-Leopoldshafen, Germany [fax: (+49)7247-808-666, e-mail: crysdata@fiz-karlsruhe.de] on quoting the depository numbers CSD-419206 (1), CSD-419044 (2), CSD-419029 (3), CSD-419031 (4), and CSD-419030 (5).
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53549100267
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-1) to room temperature. All the products obtained were air-or moisture-sensitive, crystalline, and exhibited a silvery color with metallic luster.
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-1) to room temperature. All the products obtained were air-or moisture-sensitive, crystalline, and exhibited a silvery color with metallic luster.
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33
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0023162961
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The samples were crushed under dry argon and transferred to the microscope inside an argon-filled bag. Qualitative energy dispersive X-ray (EDX) analysis confirms the absence of contaminants. Electron microscopy examinations were performed using a Philips CM30 ST (300 kV, Cs, 1.15 mm, LaB6 cathode, Gatan multiscan CCD camera, The beam sensitivity of the samples forced the use of low-dose settings. The multislice formalism[19b] was used for image simulations; b) P. A. Stadelmann, Ultramicroscopy 1987, 21, 131
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[19b] was used for image simulations; b) P. A. Stadelmann, Ultramicroscopy 1987, 21, 131.
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36
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34250821478
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D. C. Fredrickson, S. Lee, R. Hoffmann, Angew. Chem. 2007, 119, 2004;
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Fredrickson, D.C.1
Lee, S.2
Hoffmann, R.3
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53549092830
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5 impurities, respectively. No other kinks were observed in the cooling curves of the samples, which suggests the absence of further superconducting phases down to 1.8 K.
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5 impurities, respectively. No other kinks were observed in the cooling curves of the samples, which suggests the absence of further superconducting phases down to 1.8 K.
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39
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27544465453
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S. Ponou, N. Müller, T. F. FQssler, U. Häussermann, Inorg. Chem. 2005, 44, 7423.
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Inorg. Chem
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Ponou, S.1
Müller, N.2
FQssler, T.F.3
Häussermann, U.4
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