Measurement of the Ar diffusion coefficient in graphite at high temperature by the ISOL method

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 19-20, 2008, Pages 4284-4288

  Eleon C ^a   Jardin, P ^a   Thomas, J C ^a   Saint Laurent, M G ^a   Huet Equilbec, C ^a   Alves Conde R ^a   Angelique J C ^b,g   Boilley, D ^a   Cornell, J ^a   Dubois, M ^a   Franberg, H ^c,d   Gaubert, G ^a   Jacquot, B ^a   Koster U ^d,e   Leroy, R ^a   Maunoury, L ^f   Orr, N ^g   Pacquet, J Y ^a   Pellemoine, F ^a   Stodel, C ^a   Turrion, M ^h   more..

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^b UNIVERSITÉ JOSEPH FOURIER GRENOBLE 1   (France)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d CERN   (Switzerland)

^e INSTITUT LAUE LANGEVIN   (France)

^f Centre Interdisciplinaire de Recherches Ions Laser   (France)

^g Laboratoire de Physique Corpusculaire   (France)

^h INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

Author keywords

Ar; Diffusion; Graphite; ISOL

Indexed keywords

CARBON; GRAPHITE; RADIOACTIVE ELEMENTS;

AR; DIFFUSION; DIFFUSION CO-EFFICIENT; EUROPEAN; HIGH TEMPERATURE; ISOL;

SEMICONDUCTOR DOPING;

EID: 53449090279     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.05.061     Document Type: Article

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