Critical behavior for the onset of type-III intermittency observed in an electronic circuit

Physical Review E

Volumn 52, Issue 4, 1995, Pages 4520-4522

  Ono, Y ^a   Fukushima, K ^a   Yazaki, T ^b  

^a KUMAMOTO UNIVERSITY   (Japan)

^b AICHI UNIVERSITY OF EDUCATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5344245672     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.52.4520     Document Type: Article

References (9)