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Volumn , Issue , 1992, Pages 14-17

Ingaas/inp double channel HEMT on InP

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; GALLIUM ALLOYS; GALLIUM COMPOUNDS; HIGH ELECTRON MOBILITY TRANSISTORS; III-V SEMICONDUCTORS; INDIUM ALLOYS; INTEGRATED OPTOELECTRONICS; PIXELS; SEMICONDUCTING INDIUM; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR ALLOYS;

EID: 5344221080     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIPRM.1992.235699     Document Type: Conference Paper
Times cited : (24)

References (10)
  • 7
    • 0023309157 scopus 로고
    • Real space hot electron distributions and transfer effects in heterostructures
    • Y. Cho, R. Sakamoto, and M. Inoue, "REAL SPACE HOT ELECTRON DISTRIBUTIONS AND TRANSFER EFFECTS IN HETEROSTRUCTURES", Solid-State Electronics, Vol. 31, No. 3/4, p. 325, 1988.
    • (1988) Solid-state Electronics , vol.31 , Issue.3-4 , pp. 325
    • Cho, Y.1    Sakamoto, R.2    Inoue, M.3
  • 8
    • 0025519250 scopus 로고
    • Delay time analysis for 0.4- to 5-μm-gate InAIAs-InGaAs HEMT's
    • T. Enoki, K. Arai, and Y. Ishii, "Delay Time Analysis for 0.4- to 5-μm-Gate InAIAs-InGaAs HEMT's", IEEE Electron Device Letters, Vol. 11, No. 11, p. 502, 1990.
    • (1990) IEEE Electron Device Letters , vol.11 , Issue.11 , pp. 502
    • Enoki, T.1    Arai, K.2    Ishii, Y.3
  • 9
    • 0026404066 scopus 로고
    • T-gate process and delay time analysis for sub-1/4-μm-gate InAIAs/InGaAs HEMT's
    • T. Enoki, Y. Ishii, and T. Tamamura, "T-Gate Process and Delay Time Analysis for Sub-1/4-μm-Gate InAIAs/InGaAs HEMT's", Proceedings of the IPRM'91, p. 371, 1991.
    • (1991) Proceedings of the IPRM'91 , pp. 371
    • Enoki, T.1    Ishii, Y.2    Tamamura, T.3
  • 10
    • 0025416050 scopus 로고
    • New continuous heterostructure field-effect-transistor model and unified parameter extraction technique
    • B.-J. Moon, Y. H. Byun, K. Lee, and M. Shur, "New Continuous Heterostructure Field-Effect-Transistor Model and Unified Parameter Extraction Technique", IEEE Electron Device, Vol. 37, No. 4, p. 908, 1990.
    • (1990) IEEE Electron Device , vol.37 , Issue.4 , pp. 908
    • Moon, B.-J.1    Byun, Y.H.2    Lee, K.3    Shur, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.