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Volumn 159, Issue 2-3, 2008, Pages 471-475
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Elucidating the hydration properties of paste containing thin film transistor liquid crystal display waste glass
a
c
NUU Lienda
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(Taiwan)
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Author keywords
Blended cement paste; Hydration; Pozzolanic reaction; Thin film transistor liquid crystal display
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Indexed keywords
CEMENTS;
COMPRESSIVE STRENGTH;
FOURIER ANALYSIS;
FOURIER TRANSFORMS;
GLASS;
GRAVIMETRIC ANALYSIS;
HYDRATION;
ICE;
INFRARED SPECTROSCOPY;
LIGHT SOURCES;
LIQUID CRYSTAL DISPLAYS;
LIQUID CRYSTALS;
POWDERS;
SILICATES;
SPECTROSCOPIC ANALYSIS;
SPURIOUS SIGNAL NOISE;
STRENGTH OF MATERIALS;
THICK FILMS;
THIN FILM TRANSISTORS;
THIN FILMS;
TRANSISTORS;
BLENDED CEMENT PASTE;
BLENDED CEMENTS;
FOURIER TRANSFORMATIONS;
HYDRATION PROPERTIES;
POZZOLANIC REACTION;
TFT-LCD;
THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY;
THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;
WASTE GLASSES;
THIN FILM DEVICES;
CALCIUM HYDROXIDE;
CEMENT;
SILICATE;
SILICON;
SILICON DIOXIDE;
CALCIUM;
CEMENT;
COMPRESSIVE STRENGTH;
FTIR SPECTROSCOPY;
GLASS;
HYDRATION;
NUCLEAR MAGNETIC RESONANCE;
SILICATE;
THERMOGRAVIMETRY;
ARTICLE;
CHEMICAL WASTE;
DIFFERENTIAL SCANNING CALORIMETRY;
FILM;
HYDRATION;
INFRARED SPECTROSCOPY;
LIQUID CRYSTAL;
NUCLEAR MAGNETIC RESONANCE;
SUBSTITUTION REACTION;
THERMOGRAVIMETRY;
WASTE GLASS;
X RAY DIFFRACTION;
GLASS;
INDUSTRIAL WASTE;
LIQUID CRYSTALS;
MAGNETIC RESONANCE SPECTROSCOPY;
SILICATES;
SILICONES;
SPECTROMETRY, X-RAY EMISSION;
SPECTROSCOPY, FOURIER TRANSFORM INFRARED;
THERMOGRAVIMETRY;
TRANSISTORS;
X-RAY DIFFRACTION;
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EID: 53149141797
PISSN: 03043894
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jhazmat.2008.02.044 Document Type: Article |
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Times cited : (33)
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References (13)
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