Interest of the multi-resolution analysis based on the co-occurrence matrix for texture classification

Proceedings of the Mediterranean Electrotechnical Conference - MELECON

Volumn , Issue , 2008, Pages 852-856

  Ben Othmen, M ^a   Sayadi, M ^a,b   Fnaiech, F ^a,b  

^a UNIVERSITY OF TUNIS   (Tunisia)

^b Département Génie Electrique et Informatique Industrielle   (France)

Author keywords

Classification; Classifier; Co occurrence; Euclidian distance; Texture; Wavelet

Indexed keywords

MATRIX ALGEBRA; SECURITY OF DATA; WAVELET TRANSFORMS;

CLASSIFICATION; CLASSIFIER; CO-OCCURRENCE; EUCLIDIAN DISTANCE; TEXTURE; WAVELET;

TEXTURES;

EID: 53149131349     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MELCON.2008.4618542     Document Type: Conference Paper

References (14)

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