A Study on design for testability in component-based embedded software

Proceedings - 6th ACIS International Conference on Software Engineering Research, Management and Applications, SERA 2008

Volumn , Issue , 2008, Pages 31-38

  Kanstrén, Teemu ^a  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; DISCRETE FOURIER TRANSFORMS; INDUSTRIAL ENGINEERING; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR QUANTUM DOTS; SOFTWARE ENGINEERING; SOFTWARE TESTING; SYSTEM PROGRAM DOCUMENTATION;

EMBEDDED SOFTWARES; EUROPEAN; IN COMPONENT; INTERNATIONAL CONFERENCES; SOFTWARE ENGINEERING RESEARCH; SYSTEM DESIGNS; TECHNICAL DOCUMENTATIONS; TELECOM INDUSTRY; TEST ABILITY; TEST AUTOMATION;

ENGINEERING RESEARCH;

EID: 53149098635     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SERA.2008.11     Document Type: Conference Paper

References (12)

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