Depth resolved Doppler broadening measurement of layered Al-Sn samples

Applied Surface Science

Volumn 255, Issue 1, 2008, Pages 245-247

  Pikart, Philip ^a   Hugenschmidt, Christoph ^a   Mayer, Jakob ^a   Stadlbauer, Martin ^a   Schreckenbach, Klaus ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Aluminum; Layered sample; Positron annihilation spectroscopy; Positron trapping; Tin

Indexed keywords

ALUMINUM; ALUMINUM ALLOYS; BINARY ALLOYS; DOPPLER EFFECT; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; TIN; TIN ALLOYS;

DOPPLER BROADENING MEASUREMENTS; DOPPLER BROADENING SPECTROSCOPY; HIGH PURITY MATERIALS; IMPLANTATION PROFILES; LAYERED SAMPLE; MONOENERGETIC POSITRON BEAM; POSITRON ACCELERATION; POSITRON TRAPPING;

ELECTRONS;

EID: 53049087095     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.305     Document Type: Article

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