Evidence and scenario sensitivities in naive Bayesian classifiers

International Journal of Approximate Reasoning

Volumn 49, Issue 2, 2008, Pages 398-416

  Renooij, Silja ^a   van der Gaag, Linda C ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

Naive Bayesian classifiers; Robustness; Sensitivity

Indexed keywords

CLASSIFICATION (OF INFORMATION); CLASSIFIERS; INFERENCE ENGINES; INFORMATION ANALYSIS; LEARNING SYSTEMS; STANDARDS;

EMPIRICAL EVIDENCES; INDEPENDENCE PROPERTIES; NAIVE BAYESIAN; NAIVE BAYESIAN CLASSIFIERS; ROBUSTNESS; SENSITIVITY; SENSITIVITY FUNCTIONS;

BAYESIAN NETWORKS;

EID: 52949118454     PISSN: 0888613X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijar.2008.02.008     Document Type: Article

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