Studies of the mechanism of electrical conduction in As-doped ZnO by structural and chemical-bonding analyses and first principle calculations

Solid State Communications

Volumn 148, Issue 7-8, 2008, Pages 301-304

  Shen, Yiqun ^a   Mi, Lan ^a   Xu, Xiaofeng ^a   Wu, Jiada ^a   Wang, Peinan ^a   Ying, Zhifeng ^a   Xu, Ning ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

A. As doped ZnO; B. Electronic structure; C. First principle density functional theory; D. X ray photoelectron spectroscopy

Indexed keywords

DENSITY FUNCTIONAL THEORY; LASER THEORY; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SEMICONDUCTING ZINC COMPOUNDS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC ALLOYS; ZINC OXIDE;

A. AS-DOPED ZNO; B. ELECTRONIC STRUCTURE; C. FIRST-PRINCIPLE DENSITY-FUNCTIONAL THEORY; CHEMICAL-; D. X-RAY PHOTOELECTRON SPECTROSCOPY; ELECTRICAL CONDUCTION; FIRST-PRINCIPLE CALCULATIONS; PULSED LASER DEPOSITION (PLD); X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY XPS; ZNO LATTICE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 52949113816     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2008.09.003     Document Type: Article

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