A scanning angle energy-dispersive X-ray diffraction technique for high-pressure structure studies in diamond anvil cells

High Pressure Research

Volumn 28, Issue 3, 2008, Pages 193-201

  Yang, Wenge ^a   Shen, Guoyin ^a   Wang, Yanbin ^b   Mao, Ho Kwang ^a,c  

^a CARNEGIE INSTITUTION OF WASHINGTON   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

^c GEOPHYSICAL LABORATORY   (United States)

Author keywords

Amorphous; Anomalous X ray scattering; Diamond anvil cell; Energy dispersive; Structure refinement

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DIAMONDS; DIFFRACTION; ELECTROMAGNETIC WAVES; GARNETS; GROWTH (MATERIALS); MATERIALS; PARTICLE ACCELERATORS; POWDERS; SCANNING; SIGNAL TO NOISE RATIO; SILICA; SILICATE MINERALS; SYNCHROTRON RADIATION; SYNCHROTRONS; TOOLS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS; AMORPHOUS SAMPLES; AMORPHOUS STRUCTURES; ANOMALOUS X-RAY SCATTERING; AREA DETECTORS; ATOMIC STRUCTURES; BEAM PATHS; DIAMOND ANVIL CELL; DIAMOND ANVIL-CELLS; ENERGY DISPERSIVE X RAYS; ENERGY-DISPERSIVE; HIGH-SPATIAL RESOLUTION; MINERAL PHYSICS; POWDER DIFFRACTION; SCANNING ANGLES; SCATTERING MATERIALS; SITE-SPECIFIC; SOLID-STATE DETECTOR; STRUCTURE REFINEMENT; STRUCTURE REFINEMENTS;

AMORPHOUS MATERIALS;

EID: 52949093142     PISSN: 08957959     EISSN: 14772299     Source Type: Journal    
DOI: 10.1080/08957950802246522     Document Type: Conference Paper

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