Electrodes coated by passive oxide films with a thickness profile: Modeling and measurement of the impedance response

Journal of the Electrochemical Society

Volumn 155, Issue 11, 2008, Pages

  Cattarin, Sandro ^a   Comisso, Nicola ^a   Musiani, Marco ^a   Tribollet, Bernard ^b  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b Université Pierre et Marie Curie   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COATED WIRE ELECTRODES; CONCENTRATION (PROCESS); ELECTRODES; ELECTROLYSIS; MOLECULAR BEAM EPITAXY; NIOBIUM; OHMIC CONTACTS; OXIDE FILMS; TANTALUM; TRANSITION METALS;

ANODIZATION POTENTIAL; CELL VOLTAGES; CONSTANT RATES; ELECTRODE LENGTHS; EXPERIMENTAL MODELING; EXPERIMENTAL PARAMETERS; FILM RESISTANCE; IMPEDANCE RESPONSE; LOCAL FILM THICKNESS; MODELING AND MEASUREMENT; OHMIC RESISTANCE; PASSIVE OXIDES; PHASE ANGLES; RESISTIVE FILMS; SOLUTION CONCENTRATIONS; THICKNESS PROFILES;

METALLIZING;

EID: 52649145830     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2976214     Document Type: Article

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