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Journal of Applied Physics

Volumn 58, Issue 10, 1985, Pages 3779-3783

A calibration curve for room-temperature resistivity versus donor atom concentration in Si:As

(3) Newman, P F a Hirsch, M J a Holcomb, D F a

a Sibley School of Mechanical and Aerospace Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5244381613 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.335591 Document Type: Article

Times cited : (12)

References (19)

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