Microwave field distribution in superconducting thin film devices

Journal of Applied Physics

Volumn 80, Issue 6, 1996, Pages 3566-3573

  Quenter, D ^a,b   Doderer, T ^a   Huebener, R P ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTROMAGNETIC FIELDS; ELECTRON BEAMS; IMPEDANCE MATCHING (ELECTRIC); JOSEPHSON JUNCTION DEVICES; MICROWAVES; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING FILMS;

COPPER PAIR TUNNELING CURRENT; MICROSTRIPLINE; SELF ALIGNED WHOLE WAFER PROCESS; SUPERCONDUCTING THIN FILM DEVICES; SWIHART WAVELENGTH;

THIN FILM DEVICES;

EID: 5244373575     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363230     Document Type: Article

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