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Volumn 80, Issue 1, 1996, Pages 156-160

The effect of excess gallium vacancies in low-temperature GaAs/AlAs/ GaAs:Si heterostructures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 5244240500     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362742     Document Type: Article
Times cited : (17)

References (16)
  • 12
    • 85033869497 scopus 로고    scopus 로고
    • 2, which is typical for high quality AlAs/ GaAs interfaces (Ref. 13)
    • 2, which is typical for high quality AlAs/ GaAs interfaces (Ref. 13).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.