Deposition condition and thickness dependence on magnetic properties of sputtered NiFeCo thin films

Journal of Applied Physics

Volumn 79, Issue 8 PART 2A, 1996, Pages 5446-5448

  Tsoukatos, A ^a   Gupta, S ^a   Kim, Y K ^b  

^a Materials Research Corporation   (United States)

^b Quantum Peripherals Colorado Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5244223183     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362333     Document Type: Article

References (12)

1. T. L. Hylton, K. R. Coffey, M. A. Parker, and J. K. Howard, Science 261, 1021 (1993).
2. Y. K. Kim and S. C. Sanders, Appl. Phys. Lett. 66, 1009 (1995).
3. J. W. Dykes, Y. K. Kim, A. Tsoukatos, S. Gupta, and S. C. Sanders, J. Appl. Phys. 79 (1996).
4. S. Tsunashima, M. Jimbo, T. Kanda, S. Goto, and S. Uchiyama, Mater. Res. Soc. Symp. Proc. 313, 271 (1993).
5. M. Jimbo, T. Kanda, S. Goto, S. Tsumashima, and S. Uchiyama, J. Appl. Phys. 31, L1348 (1992).
6. H. Sakakima, M. Satomi, K. Onaka, and S. Yamamoto, J. Magn. Magn. Mater. 145, L268 (1995).
7. Y. K. Kim and M. Oliveria, J. Appl. Phys. 74, 1233 (1993).
8. J. Lo, C. Hwang, T. C. Huang, and R. Cambell, J. Appl. Phys. 61, 3520 (1987).
9. R. M. Valletta, G. Guthmiller, and G. Gorman, J. Vac. Sci. Technol. A 9, 2093 (1991).
10. T. Yeh, J. M. Sivertsen, and J. H. Judy, IEEE Trans. Magn. 23, 2215 (1987).
11. D. C. Larson, Phys. Thin Films 6, 81 (1971).
12. J. C. Brice, J. A. Cundall, and A. P. King, J. Mater. Sci. 1, 170 (1966).