Laser-microwave double-resonance technique for g -factor measurements in highly charged ions

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 78, Issue 3, 2008, Pages

  Quint, W ^a   Moskovkhin, D L ^b   Shabaev, V M ^b   Vogel, M ^c  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^c IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRODYNAMICS; ELECTROLYSIS; EXPERIMENTS; LASER SPECTROSCOPY; LASERS; MAGNETIC MOMENTS; MAGNETISM; MICROWAVES; QUANTUM ELECTRONICS; RESONANCE;

BOUND-STATE QUANTUM ELECTRODYNAMICS; DIAMAGNETIC SHIELDING; G FACTORS; HIGHLY CHARGED IONS; HYPERFINE STATES; HYPERFINE TRANSITIONS; MICROWAVE TRANSITIONS; OPTICAL FLUORESCENCE; PENNING TRAPS; RESONANCE TECHNIQUE; STRINGENT TEST; ZEEMAN SUBLEVELS;

PARTICLE OPTICS;

EID: 52349108944     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.78.032517     Document Type: Article

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