Mapping local defects of extended media using localized structures

Applied Physics Letters

Volumn 93, Issue 11, 2008, Pages

  Pedaci, F ^a   Tissoni, G ^a,b   Barland, S ^a   Giudici, M ^a   Tredicce, J ^a  

^a INSTITUT NON LINÉAIRE DE NICE   (France)

^b UNIVERSITY OF INSUBRIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SURFACE EMITTING LASERS;

BROAD-AREA SEMICONDUCTOR; EXPERIMENTAL PARAMETERS; GENERAL METHOD; LOCAL DEFECTS; LOCALIZED STRUCTURES; NUMERICAL SIMULATIONS; OPTICAL INJECTION; SPATIAL GRADIENTS; SPATIO-TEMPORAL BEHAVIOR; SYSTEM PARAMETERS; VERTICAL CAVITY SURFACE EMITTING LASER;

GRADIENT METHODS;

EID: 52349105919     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2977603     Document Type: Article

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