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Volumn , Issue , 2008, Pages 2112-2115
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Wavelet-based long memory study in American and Chinese stock market
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Author keywords
Fractional Differenced Noise (FDN); Long memory; Maximal Overlap Discrete Wavelet Transform (MODWT); Wavelet variance
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Indexed keywords
ALGEBRA;
COMMERCE;
DISCRETE WAVELET TRANSFORMS;
ELECTRIC FAULT CURRENTS;
WAVELET TRANSFORMS;
CHINESE STOCK MARKET;
FINANCIAL DATA;
FRACTIONAL DIFFERENCED NOISE (FDN);
LONG MEMORIES;
LONG MEMORY;
MAXIMAL OVERLAP DISCRETE WAVELET TRANSFORM (MODWT);
NOISE PROCESSING;
STOCK MARKETS;
WAVELET VARIANCE;
INVENTORY CONTROL;
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EID: 52349097101
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CCDC.2008.4597697 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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