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Volumn , Issue , 2008, Pages 9-11

Derivation of threshold voltage and drain current for cylindrical MOSFET and application to a recessed MOSFET

Author keywords

Cylindrical MOSFET; Recessed gate MOSFET; Threshold voltage

Indexed keywords

ANALYTICAL CALCULATIONS; APPROXIMATE EXPRESSIONS; CYLINDRICAL MOSFET; DRIVE CURRENTS; RECESSED GATE MOSFET; TCAD SIMULATIONS;

EID: 52349092225     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WMED.2008.4510655     Document Type: Conference Paper
Times cited : (2)

References (4)
  • 2
    • 49049117624 scopus 로고    scopus 로고
    • S-RCAT Technology for 70nm DRAM feature size and beyond
    • J.Y. Kim et. al, "S-RCAT Technology for 70nm DRAM feature size and beyond", VLSI Symposium 2005, pp34-35
    • (2005) VLSI Symposium , pp. 34-35
    • Kim, J.Y.1    et., al.2
  • 3
    • 0025575449 scopus 로고
    • A Novel Source-to-Drain Nonuniformly Doped Channel (NUDC) MOSFET for High Current Drivability and Threshold Voltage Controllability
    • Y. Okumura et. al, "A Novel Source-to-Drain Nonuniformly Doped Channel (NUDC) MOSFET for High Current Drivability and Threshold Voltage Controllability", IEDM 1990 pp391-394
    • (1990) IEDM , pp. 391-394
    • Okumura, Y.1    et., al.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.