Sensitive far-IR survey spectroscopy: BLISS for SPICA

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7020, Issue , 2008, Pages

  Bradford, C M ^l   Kenyon, Matt ^l   Holmes, Warren ^l   Bock, James ^l   Koch, Timothy ^l   Day, P ^a   Nguyen, H ^a   Werner, M ^a   Cofield, R ^a   Paine, C ^a   Irwin, K ^b   Harwit, M ^c   Stacey, G ^c   Helou, G ^d   Armus, L ^d   Smith, J D ^e   Chapman, S ^f   Rieke, G ^g   Lester, D ^h   Nakagawa, T ⁱ   Matsuhara, H ⁱ   Onaka, T ⁱ   Shibai, H ^j   Tamura, M ^k   more..

^a JPL

^b NIST

^c Department of Obstetrics Gynecology

^d CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^e U of Toledo   (United States)

^f U Arizona ^*

^g UNIVERSITY OF ARIZONA   (United States)

^h U Texas   (United States)

ⁱ UNIVERSITY OF TOKYO   (Japan)

^j NAGOYA UNIVERSITY   (Japan)

^k NAOJ

^l CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

more..

Author keywords

BLISS; Bolometers; Far IR; Spectroscopy; SPICA

Indexed keywords

BOLOMETERS; CHEMICAL ELEMENTS; GALAXIES; INFRARED DETECTORS; SPECTROMETERS;

3.5-METER TELESCOPE; BLISS; FAR-IR; FINE STRUCTURE TRANSITIONS; LOW BACKGROUND; MODERATE RESOLUTION; MOLECULAR TRANSITIONS; RED SHIFT; SPICA; SUBMILLIMETRE;

SURVEYS;

EID: 52249096140     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.790156     Document Type: Conference Paper

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