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Volumn 7013, Issue , 2008, Pages

SIM-Lite: Status of the engineering progress towards flight

Author keywords

Interferometry; Picometer; SIM; Space interferometry mission

Indexed keywords

GEODETIC SATELLITES; INTERFEROMETERS; INTERFEROMETRY; PIEZOELECTRIC TRANSDUCERS; TECHNOLOGY; TESTING;

EID: 52249085620     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.789828     Document Type: Conference Paper
Times cited : (5)

References (13)
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    • 12 doc 177 in this proceeding.
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  • 3
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    • Error modeling of multi-baseline optical truss: Part ii. applications to sim metrology truss field dependent error
    • Peterson, L. D. and Guyer, R. C, eds, SPIE
    • Zhang, L. D., Milman, M. H., and Korechoff, R. E., "Error modeling of multi-baseline optical truss: part ii. applications to sim metrology truss field dependent error," in [Space Systems Engineering and Optical Alignment Mechanisms], Peterson, L. D. and Guyer, R. C., eds., 5528, pp.245-254, SPIE (2004).
    • (2004) Space Systems Engineering and Optical Alignment Mechanisms] , vol.5528 , pp. 245-254
    • Zhang, L.D.1    Milman, M.H.2    Korechoff, R.E.3
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    • W. C. Danchi, Delplancke, M. S, ed, SPIE
    • W. C. Danchi, Delplancke, M. S., ed., [Optical and Infrared Interferometry], 7013, SPIE (2008).
    • (2008) Optical and Infrared Interferometry] , vol.7013
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    • Danchi, J. D. M. M. S. W. C, ed, SPIE
    • Danchi, J. D. M. M. S. W. C., ed., [Advances in Stellar Interferometry], 6268, SPIE (2006).
    • (2006) Advances in Stellar Interferometry] , vol.6268


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.