The mask designs for Space Interferometer Mission (SIM)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7013, Issue , 2008, Pages

  Wang, Xu ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Diffraction; Interferometry; Metrology

Indexed keywords

DIFFRACTION MODELS; GEOMETRICAL DIMENSIONS; INFRA RED INTERFEROMETRY; MASK DESIGNS; METROLOGY; OPTICAL PATHS; OPTICAL-; SENSITIVITY STUDIES; SPACE INTERFEROMETER MISSION; SYSTEM PERFORMANCES; SYSTEM REQUIREMENTS;

DIFFRACTION; GEODETIC SATELLITES; INTERFEROMETERS; OPTICAL INSTRUMENTS; REQUIREMENTS ENGINEERING;

INTERFEROMETRY;

EID: 52249085394     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.787256     Document Type: Conference Paper

References (4)

1. R. Laskin, "SIMtechnology overview", Proc. SPIE, Volume 4852, pi6-32, June 2002
2. R. P. Korechoff, D. J. Hoppe, X. Wang, "Sub-nanometer level model validation of the SIM interferometer", Proceedings of SPIE, Volume 5491, p361-372, June, 2004
3. FORTRAN code developed by R. Benson, documented by various memos in the SIM-lib 4. Xu Wang, "Grid_and_NA_Metric_Code_June_2006", SIM-lib Document #215020, June 27, 2006.
4. Xu Wang, Robert Korechoff, Mike Heflin, Lisa Sievers, "Corner cube model for internal metrology system of Space Interferometer Mission (SIM), Proceedings of SPIE, Volume 6268, 62682p, May, 2006