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Volumn 49, Issue 3, 2008, Pages 477-481
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X-ray diffraction analysis of microregions of a cumulative coating on titanium
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Author keywords
Full profile refinement; Microhardness; Titanium; Titanium nitride; X ray phase analysis
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Indexed keywords
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EID: 52149113551
PISSN: 00224766
EISSN: None
Source Type: Journal
DOI: 10.1007/s10947-008-0065-9 Document Type: Article |
Times cited : (3)
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References (9)
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