RDA for automatic airport recognition on FLIR image

Proceedings of the World Congress on Intelligent Control and Automation (WCICA)

Volumn , Issue , 2008, Pages 5966-5969

  Liu, Wei ^a   Tian, Jinwen ^a   Chen, Xinwu ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Airport recognition; Infrared image; Singularity; Two parameter RDA; Within class covariance

Indexed keywords

CLASSIFICATION (OF INFORMATION); CLASSIFIERS; COVARIANCE MATRIX; DISCRIMINANT ANALYSIS; ELECTRIC POWER PLANTS; IMAGE ENHANCEMENT; IMAGING SYSTEMS; IMAGING TECHNIQUES; INDUSTRIAL ENGINEERING; INFRARED IMAGING; INTELLIGENT CONTROL; LEARNING SYSTEMS; MAXIMUM LIKELIHOOD ESTIMATION; OBJECT RECOGNITION; POWER PLANTS;

AIRPORT RECOGNITION; CONTROL AND AUTOMATION; FLIR IMAGES; FORWARD-LOOKING INFRARED; INFRARED IMAGE; MAXIMUM-LIKELIHOOD; PLUG INS; QUADRATIC DISCRIMINANT ANALYSIS; REAL TIME; REGULARIZED DISCRIMINANT ANALYSIS; SINGULARITY; SYSTEM FRAME; TRAINING SAMPLES; TWO-PARAMETER RDA; WITHIN-CLASS COVARIANCE;

AIRPORTS;

EID: 52149107821     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCICA.2008.4592845     Document Type: Conference Paper

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