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Volumn 455, Issue 7211, 2008, Pages
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Optics: Farewell to Flatland
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Author keywords
[No Author keywords available]
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Indexed keywords
BIOMATERIAL;
LIGHT;
OPTICAL INSTRUMENT;
OPTICAL METHOD;
REFRACTIVE INDEX;
LIGHT INTENSITY;
PRIORITY JOURNAL;
REFRACTION INDEX;
SEMICONDUCTOR;
SHORT SURVEY;
SPECTRAL SENSITIVITY;
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EID: 52149093261
PISSN: 00280836
EISSN: 14764687
Source Type: Journal
DOI: 10.1038/455299a Document Type: Short Survey |
Times cited : (5)
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References (12)
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