Fast estimation of total quality factor of photonic crystal slab cavities

Biennial University/Government/Industry Microelectronics Symposium - Proceedings

Volumn , Issue , 2008, Pages 233-235

  Liu, T ^a   Panepucci, R R ^a  

^a Florida International University   (United States)

Author keywords

Effective index method; FDTD; Optical cavity; Photonic crystal

Indexed keywords

BANDPASS FILTERS; CRYSTAL ATOMIC STRUCTURE; ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROMAGNETISM; ESTIMATION; INDUSTRIAL MANAGEMENT; MAGNETIC FIELDS; MICROCAVITIES; NONLINEAR OPTICS; NONMETALS; NUMERICAL METHODS; PHOTONIC CRYSTALS; PHOTONIC DEVICES; POWDERS; Q FACTOR MEASUREMENT; SCATTERING; SILICON; TOTAL QUALITY MANAGEMENT; TWO DIMENSIONAL;

3D-FDTD; CAVITY GEOMETRY; CAVITY MODE; EFFECTIVE INDEX; EFFECTIVE INDEX METHOD; FAST ESTIMATION; FD-TD TECHNIQUES; FDTD; FIELD PROFILE; FINITE DIFFERENCE TIME DOMAINS; IN-PLANE; NEAR-FIELD SCATTERING; OPTICAL CAVITY; PHOTONIC CRYSTAL; PHOTONIC-CRYSTAL SLABS; PLANE-WAVE EXPANSION; QUALITY FACTOR; QUALITY FACTORS; SCATTERING LOSSES;

FINITE DIFFERENCE TIME DOMAIN METHOD;

EID: 52149092313     PISSN: 07496877     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/UGIM.2008.68     Document Type: Conference Paper

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