Electrostatically self-assembled films containing II-VI semiconductor nanoparticles: Optical and electrical properties

Thin Solid Films

Volumn 516, Issue 24, 2008, Pages 8917-8925

  Suryajaya, ^a   Nabok, A V ^a   Tsargorodskaya, A ^a   Hassan, A K ^a   Davis, F ^b  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

CdS; Colloid nanoparticles; Electrostatic self assembly; Ellipsometry; Mercury probe; ZnS

Indexed keywords

CADMIUM COMPOUNDS; COLLOIDS; CONDUCTIVE FILMS; DATA STORAGE EQUIPMENT; ELECTRIC PROPERTIES; ELECTRON TUNNELING; GEOMETRICAL OPTICS; MERCURY (METAL); MOLECULAR BEAM EPITAXY; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; OPTICAL ENGINEERING; OPTICAL PROPERTIES; ORGANIC POLYMERS; OXIDE FILMS; PHOTOLITHOGRAPHY; POLYMERS; REFRACTIVE INDEX; SELF ASSEMBLY; SEMICONDUCTING CADMIUM COMPOUNDS; THICK FILMS; TIN; TITANIUM COMPOUNDS; ZINC SULFIDE;

ALLYLAMINE HYDROCHLORIDE; CDS; COLLOID NANOPARTICLES; CONDUCTIVE ELECTRODES; DEPOSITED LAYERS; ELECTROSTATIC SELF-ASSEMBLY; ELLIPSOMETRY; EXTINCTION CO-EFFICIENT; I-V CHARACTERISTICS; II-VI SEMICONDUCTORS; INDIUM-TIN OXIDE; MERCURY PROBE; MERCURY PROBE TECHNIQUE; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL METHODS; POLYELECTROLYTE FILMS; SELF-ASSEMBLED FILMS; SEMICONDUCTING NANOPARTICLES; THIN FILMS; TOTAL INTERNAL REFLECTION ELLIPSOMETRY; ZNS;

SEMICONDUCTING FILMS;

EID: 52149086832     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.11.067     Document Type: Article

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