A new radiation hardened by design latch for Ultra-Deep-Sub-Micron Technologies

Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008

Volumn , Issue , 2008, Pages 175-176

  Huang, Zhengfeng ^a   Liang, Huaguo ^a  

^a HEFEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COSMOLOGY; ELECTRIC NETWORK ANALYSIS; ERRORS; HARDENING; RADIATION HARDENING; RADIATION PROTECTION; TECHNOLOGY; URANIUM POWDER METALLURGY;

AREA EFFICIENT; DEEP-SUB MICRON; ON-LINE TESTING; POWER DISSIPATIONS; POWER-DELAY PRODUCTS; POWER-EFFICIENT; PROPAGATION DELAYS; RADIATION-HARDENED; SOFT ERRORS; SPICE SIMULATIONS;

ERROR CORRECTION;

EID: 52049116687     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2008.9     Document Type: Conference Paper

References (9)

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