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Volumn 602, Issue 18, 2008, Pages 3006-3009

Surface preparation and characterization of single crystalline β-FeSi2

Author keywords

Ironsilicide; Low index; Scanning tunneling microscopy; Single crystal surfaces; Surface relaxation and reconstruction

Indexed keywords

IRONSILICIDE; LOW INDEX; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTAL SURFACES; SINGLE-CRYSTALLINE; SURFACE PREPARATIONS; SURFACE RELAXATION AND RECONSTRUCTION;

EID: 52049091242     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.07.035     Document Type: Article
Times cited : (5)

References (21)
  • 2
    • 0003996302 scopus 로고    scopus 로고
    • Borisenko V.E. (Ed), Springer, Berlin
    • In: Borisenko V.E. (Ed). Semiconducting Silicides (2000), Springer, Berlin
    • (2000) Semiconducting Silicides
  • 3
    • 52049084225 scopus 로고    scopus 로고
    • K. Miyake, Y. Makita, Y. Maeda, T. Suemasu (Eds.), Special Issue on Silicide Kankyo-Semiconductors, Thin Solid Films 381 (2001) 171.
    • K. Miyake, Y. Makita, Y. Maeda, T. Suemasu (Eds.), Special Issue on Silicide Kankyo-Semiconductors, Thin Solid Films 381 (2001) 171.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.