Sensing increased image resolution using aperture masks

26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Volumn , Issue , 2008, Pages

  Mohan, Ankit ^a   Huang, Xiang ^a   Tumblin, Jack ^a   Raskar, Ramesh ^b,c  

^a NORTHWESTERN UNIVERSITY   (United States)

^b MITSUBISHI ELECTRIC RESEARCH LABORATORIES   (United States)

^c MIT MEDIA LAB   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERA SENSORS; CAPTURE SYSTEM; DEFOCUS; IMAGE MERGING; LENS APERTURE; MULTIPLE IMAGES; MULTIPLE PHOTOS; REGISTRATION ERRORS; RESOLUTION IMAGING; SIMULATED RESULTS; SUB PIXELS; SUPER RESOLUTIONS; THEORETICAL ANALYSIS;

ARTIFICIAL INTELLIGENCE; COMPUTER VISION; ELECTRIC NETWORK ANALYSIS; FEATURE EXTRACTION; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE RESOLUTION; LAWS AND LEGISLATION; LENSES; OPTICAL INSTRUMENTS; PATTERN RECOGNITION; SENSORS;

CAMERAS;

EID: 51949118857     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587833     Document Type: Conference Paper

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