The logistic random field - A convenient graphical model for learning parameters for mrf-based labeling

26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Volumn , Issue , 2008, Pages

  Tappen, Marshall F ^a   Samuel, Kegan G G ^a   Dean, Craig V ^a   Lyle, David M ^a  

^a University of Central Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRA; ARTIFICIAL INTELLIGENCE; COMPUTER VISION; FEATURE EXTRACTION; GRAPHIC METHODS; IMAGE PROCESSING; LABELING; PATTERN RECOGNITION; QUADRATIC PROGRAMMING; SPEECH RECOGNITION; STANDARDS;

APPLICATIONS.; FUNDAMENTAL TOOLS; GRAPHICAL MODELLING; GRAPHICAL MODELS; LEARNING PARAMETERS; LOG-LIKELIHOOD; LOGISTIC FUNCTIONS; NUMERICAL LINEAR ALGEBRA; QUADRATIC MODELING; RANDOM FIELD; TRAINING DATA;

LINEAR ALGEBRA;

EID: 51949118679     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587669     Document Type: Conference Paper

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