Order consistent change detection via fast statistical significance testing

26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Volumn , Issue , 2008, Pages

  Singh, Maneesh ^a   Parameswaran, Vasu ^a   Ramesh, Visvanathan ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER VISION; FEATURE EXTRACTION; FOOD PROCESSING; IMAGE PROCESSING; PATTERN RECOGNITION; SIGNAL DETECTION; STATISTICAL METHODS;

CHANGE-DETECTION; FAST ALGORITHMS; FUNDAMENTAL BUILDING BLOCK; GLOBAL ILLUMINATION; ILLUMINATION VARIATIONS; MATCHING ALGORITHMS; RANDOM NOISES; REAL IMAGE SEQUENCES; STATE OF THE ARTS; STATISTICAL PROPERTIES; STATISTICAL SIGNIFICANCE; STATISTICAL SIMULATIONS; SUPERIOR PERFORMANCE; TRADE OFFS; VISUAL SURVEILLANCE;

STATISTICAL TESTS;

EID: 51949110996     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587668     Document Type: Conference Paper

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