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Volumn , Issue , 2008, Pages

An LED-only BRDF measurement device

Author keywords

[No Author keywords available]

Indexed keywords

BIDIRECTIONAL TRANSMITTANCE DISTRIBUTION FUNCTION; LIGHT EMITTERS; MEASUREMENT DESIGNS; MEASUREMENT DEVICES; MULTI-SPECTRAL; OCCLUSION PROBLEMS;

EID: 51949108815     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587766     Document Type: Conference Paper
Times cited : (61)

References (22)
  • 4
    • 0027577002 scopus 로고
    • Blue LEDs, UV photodiodes and high-temperature rectifiers in 6H-SiC
    • J. Edmond, H. Kong, and C. Carter. Blue LEDs, UV photodiodes and high-temperature rectifiers in 6H-SiC. Physica B, 185(1-4):453-460, 1993.
    • (1993) Physica B , vol.185 , Issue.1-4 , pp. 453-460
    • Edmond, J.1    Kong, H.2    Carter, C.3
  • 10
    • 0003870990 scopus 로고    scopus 로고
    • Image-based bidirectional reflectance distribution function measurement
    • S. Marschner, S. Westin, E. Lafortune, and K. Torrance. Image-based bidirectional reflectance distribution function measurement. App. Opt, 39:2592-2600, 2000.
    • (2000) App. Opt , vol.39 , pp. 2592-2600
    • Marschner, S.1    Westin, S.2    Lafortune, E.3    Torrance, K.4
  • 12
    • 0000955476 scopus 로고
    • Sun photometer with light-emitting diodes as spectrally selective detectors
    • F. Mims III. Sun photometer with light-emitting diodes as spectrally selective detectors. Applied Optics, 31(33):6965-6967, 1992.
    • (1992) Applied Optics , vol.31 , Issue.33 , pp. 6965-6967
    • Mims III, F.1
  • 13
    • 51949119180 scopus 로고    scopus 로고
    • F. Nicodemus, N. B. of Standards, and U. States. Geometrical Considerations and Nomenclature for Reflectance. US Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., US Govt. Print. Off., 1977.
    • F. Nicodemus, N. B. of Standards, and U. States. Geometrical Considerations and Nomenclature for Reflectance. US Dept. of Commerce, National Bureau of Standards: for sale by the Supt. of Docs., US Govt. Print. Off., 1977.
  • 18
    • 0036564141 scopus 로고    scopus 로고
    • W. Snyder, A. Inc, and M. Burlington. Definition and invariance properties of structured surface BRDF. IEEE Tran. on Geoscience and Remote Sensing, 40(5):1032-1037, 2002.
    • W. Snyder, A. Inc, and M. Burlington. Definition and invariance properties of structured surface BRDF. IEEE Tran. on Geoscience and Remote Sensing, 40(5):1032-1037, 2002.
  • 19
    • 51949092990 scopus 로고    scopus 로고
    • High Speed Measurement of BRDF Using an Ellipsoidal Mirror
    • K. Sumino, Y. Mukaigawa, and Y. Yagi. High Speed Measurement of BRDF Using an Ellipsoidal Mirror. ACCV, 2007.
    • (2007) ACCV
    • Sumino, K.1    Mukaigawa, Y.2    Yagi, Y.3
  • 21
    • 0026887589 scopus 로고
    • Measuring and modeling anisotropic reflection
    • G. Ward. Measuring and modeling anisotropic reflection. ACM SIGGRAPH, 26(2):265-272, 1992.
    • (1992) ACM SIGGRAPH , vol.26 , Issue.2 , pp. 265-272
    • Ward, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.