Light-invariant fitting of active appearance models

26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR

Volumn , Issue , 2008, Pages

  Pizarro, Daniel ^a   Peyras, Julien ^b   Bartoli, Adrien ^b  

^a UNIVERSITY OF ALCALÁ   (Spain)

^b LASMEA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE APPEARANCE MODELS; EXTERNAL-; RESPONSE PARAMETERS; SELF-CALIBRATION; SELF-SHADING; TEST IMAGES; TWO TYPES;

ARTIFICIAL INTELLIGENCE; COMPUTER VISION; FEATURE EXTRACTION; IMAGE PROCESSING; LIGHTING; PATTERN RECOGNITION; PHOTOMETRY;

CAMERAS;

EID: 51949106855     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2008.4587651     Document Type: Conference Paper

References (12)

1. S. Baker, R. Gross, I. Matthews, and T. Ishikawa. Lucaskanade 20 years on: A unifying framework: Part 2. Technical Report CMU-RI-TR-03-35, Robotics Institute. Carnegie Mellon University, Pittsburgh PA, 2003.
2. S. Baker and I. Matthews. Equivalence and efficiency of image alignment algorithms. Proc. of IEEE Conf. on Computer Vision and Pattern Recognition, 1:1090-1097, 2001.
3. S. Baker and I. Matthews. Lucas-kanade 20 years on: A unifying framework. International Journal of Computer Vision, 56(3):221-255, 2004.
4. T. Cootes, G. Edwards, and C.J. Taylor. Active appearance models. Transactions on Pattern Analysis and Machine Intelligence, 23(6):681-685, june 2001.
5. Graham D. Finlayson, Steven D. Hordley, Cheng Lu, and Mark S. Drew. On the removal of shadows from images. Transactions on Pattern Analysis and Machine Intelligence, 28:59-68, January 2006.
6. F. Kahraman, M. Gokmen, S. Darkner, and R. Larsen. An active illumination and appearance (aia) model for face alignment. In Proc. of IEEE Conf. on Computer Vision and Pattern Recognition, June 2007.
7. S. Kim and M. Pollefeys. Robust radiometric calibration and vignetting correction. Transactions on Pattern Analysis and Machine Intelligence, 30(4):562-576, 2008.
8. S.J. Kim and M. Pollefeys. Radiometric self-alignment of image sequences. In Proc. of IEEE Conf. on Computer Vision and Pattern Recognition, 2004.
9. I. Matthews and S. Baker. Active appearance models revisited. International Journal on Computer Vision, 60(2):135-164, November 2004.
10. D. Pizarro and A. Bartoli. Shadow resistant direct image registration. In Scandinavian Conference on Image Analysis, Aalborg, Denmark, June 2007.
11. T. Sim and T. Kanade. Combining models and exemplars for face recognition: An illuminating example. Proc. of IEEE Conf. on Computer Vision and Pattern Recognition, 2001.
12. S. Yan, C. Liu, S.Z. Li, H. Zhang, H.Y. Shum, and Q. Cheng. Face alignment using texture-constrained active shape models. Image and Vision Computing, 21(1):69-75, 2003.